Browsing by Subject "buried oxide"

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    • A fully embedded Silicon On Insulator Total Ionizing Dose monitor 
      Ni, Kai (2013-07-31)
      Department: Electrical Engineering
      Total ionizing dose (TID) effect is a kind of radiation effects. It’s related with the charge build up in the insulator caused by the radiation. This radiation induced charge build up will pose reliability issue and is a ...