Show simple item record

Perturbation Theory for Thin Cladding Layers on Silicon Photonic Systems

dc.contributor.advisorWeiss, Sharon M., 1977-
dc.contributor.authorPhare, Christopher
dc.description.abstractI develop a perturbation theory for resonant frequency shifts caused by thin layer of material added to dielectric systems.  This development can be used to effectively model photonic surface-sensing systems, which use this resonance shift to measure the presence of, e.g., biomolecules attached to the sensor system.  Direct modeling was previously intractable due to extremely long simulation times required to account for the cladding layers.  The developed theory is verified against a special-case direct simulation and by measuring the shift caused by silicon dioxide deposited on a fabricated ring-resonator sensor.en_US
dc.publisherVanderbilt University. Dept. of Physics and Astronomyen_US
dc.subjectring resonatoren_US
dc.subjectperturbation theoryen_US
dc.subjectphotonic crystalen_US
dc.subject.lcshPerturbation (Mathematics)en_US
dc.subject.lcshDielectric filmsen_US
dc.subject.lcshThin filmsen_US
dc.subject.lcshDielectric resonatorsen_US
dc.titlePerturbation Theory for Thin Cladding Layers on Silicon Photonic Systemsen_US
dc.description.collegeCollege of Arts and Scienceen_US
dc.description.schoolVanderbilt Universityen_US
dc.description.departmentDepartment of Physics and Astronomyen_US

Files in this item


This item appears in the following Collection(s)

Show simple item record