Browsing by Author "Bharat L. Bhuva"
Now showing items 21-28 of 28
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Wei, Xing (2012-04-12)Department: Electrical EngineeringSensitive label-free optical biosensors based on grating-coupled porous silicon (PSi) waveguides are demonstrated for biosensing applications. This is the first time that the benefits of both PSi and diffraction gratings ...
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Chatterjee, Indranil (2012-04-05)Department: Electrical EngineeringCMOS technologies can be either dual-well or triple-well. Triple-well technology has several advantages compared to dual-well technology in terms of electrical performance. Differences in the ion-induced single-event ...
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Olson, Brian David (2010-12-16)Department: Electrical EngineeringAnalog-to-digital converters (ADCs) are necessary circuits in many space, military, and medical circuit applications. Intelligence, surveillance, reconnaissance, and communication missions all require high performance ...
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Casey, Megan Colleen (2009-12-21)Department: Electrical EngineeringWith decreasing feature sizes, transistors are being added to ICs in consistently greater numbers, which is leading to dramatic increases in power consumption. Changing process parameters and redesigning circuits are ...
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Single-Event Multiple-Transient Characterization and Mitigation via Standard Cell Placement Methods Kiddie, Bradley Thomas (2016-09-28)Department: Electrical EngineeringThe effects of radiation on the operation of integrated circuits (IC) continue to take a more important role as technology feature sizes scale down, critical charge decreases, and operating frequencies increase. In space ...
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Gaspard, Nelson Joseph III (2017-03-17)Department: Electrical EngineeringAlpha, heavy-ion, neutron, and proton experimental results from 130-nm to 28-nm technology nodes are establish single-event upset cross section trends in soft and hardened flip-flop designs. Trends show that at any LET ...
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Ossi, Edward John (2011-12-09)Department: Electrical EngineeringSoft-error mitigation using design techniques at the architecture-level can overcome the limitations of process and circuit-level mitigation techniques in advanced technologies. This thesis presents two architecture-level ...
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Jagannathan, Srikanth (2013-11-27)Department: Electrical EngineeringRapid downscaling of CMOS technology has resulted in significant improvement in the RF performance of Silicon MOSFETs. As a result, standard CMOS technology has become a popular choice for implementing RF applications. ...