Browsing by Author "Bharat Bhuva"
Now showing items 1-13 of 13
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Yilmaz, Mesut (2019-08-19)Department: Electrical EngineeringCathodes are one of the most important components of energy generation/storage devices. In dye-sensitized solar cells (DSSCs) and photocapacitors, cathodes are critical in determining the cell’s properties such as the ...
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Akbulut, Serkan (2017-06-19)Department: Electrical EngineeringGlobal warming, fuel crisis and massive energy consumption of modern industrial societies have resulted in a greater focus on research and development of advanced energy storage devices. However, it is not possible to meet ...
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Mahatme, Nihaar Nilesh (2011-12-06)Department: Electrical EngineeringSingle Event Effects (SEE) in combinational logic circuits, caused due radiation particle strikes are a major concern for modern high-speed devices. The frequency dependence of SEE in state-of-the-art 40 nm circuits is ...
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Mahatme, Nihaar Nilesh (2014-12-10)Department: Electrical EngineeringEnsuring low power operation is a major challenge for designers in the era of portable devices, cloud computing and networked sensor systems. Concomitantly, combinational logic soft errors caused by radiation particle ...
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Maharrey, Jeffrey Alan (2018-04-02)Department: Electrical EngineeringAs design choices within a single CMOS technology become ever more complex with each new technology generation, and power consumption constraints push operating voltages lower, this research provides guidance into the ...
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Wang, Xiaowen (2019-03-28)Department: Electrical EngineeringTiming analysis and timing closure are critical for digital circuit design. Traditional designs based on the worst-case delay to set timing constraints. However, a circuit could have dramatically different internal activity ...
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Kumar, Pranav Srinivas (2016-10-19)Department: Computer ScienceDistributed real-time embedded systems that address safety and mission-critical system requirements are applied in a variety of heterogeneous domains today e.g. avionics, automotive systems, locomotives, and industrial ...
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Neema, Himanshu (2018-01-19)Department: Computer ScienceSystems-of-Systems (SoS) are composed of several interacting and interdependent systems that necessitate the integration of complex, heterogeneous models that represent the ensemble from different points of view, such as ...
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Harrington, Rachel Christine (2019-05-15)Department: Electrical EngineeringAt each emerging technology node, characterization of single-event transients and upsets is crucial to accurately predict soft error rates for circuits operating in radiation environments. While experimental single-event ...
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Zhu, Xiaowei (2002-11-03)Department: Electrical EngineeringIn this work the impact of technology trends on alpha particle induced soft error rates in state-of-the-art commercial microprocessors has been investigated. At the device level, both critical charge and charge collection ...
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Moktader, Arif (2016-11-30)Department: Electrical EngineeringThis paper looks at single-event upset characterization of flip flops across total ionizing dose (TID) exposures and annealing current for a 20-nm bulk, planar, CMOS technology. 20-nm chips were irradiated to five different ...
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Toomey, Corey Thomas (2011-04-12)Department: Electrical EngineeringSoft errors are becoming an increasingly important issue in today’s microelectronics industry. With decreasing transistor sizes and increasing transistor counts, it is simply not efficient to harden every circuit module ...
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Narayanan, Anantha (2008-05-14)Department: Computer ScienceModel based software development projects are typically built over tool-chains that tie modeling, verification and code generation together. Models must usually be transformed to the appropriate notation at each step. These ...