Browsing by Subject "BEOL"

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    • Radiation Response in MOS Devices with High-K Gate Oxides and Metal Gates 
      Dasgupta, Aritra (2011-09-02)
      Department: Electrical Engineering
      The effects of low and medium energy x-rays on MOS capacitors with SiO2 or HfO2 gate dielectrics and Al and TaSi gate metallization have been studied using the Monte Carlo simulator, MRED. We find good agreement between ...