Browsing by Subject "combinational logic"
Now showing items 1-3 of 3
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(2014-12-10)Department: Electrical EngineeringEnsuring low power operation is a major challenge for designers in the era of portable devices, cloud computing and networked sensor systems. Concomitantly, combinational logic soft errors caused by radiation particle ...
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(2012-12-14)Department: Electrical EngineeringRadiation-induced soft errors are becoming a dominant reliability-failure mechanism in modern CMOS technologies. In nanometer technologies, the effects are not limited to the storage elements of a digital system, but also ...
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(2012-03-26)Department: Electrical EngineeringAs feature sizes and operating voltages decrease, single-event transients from particle strikes in logic circuits become more probable. Much literature is available on the effects of these events in memory, but with ...