Browsing by Subject "critical charge"
Now showing items 1-2 of 2
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(2021-05-14)Department: Electrical EngineeringIn this work, single-event upset responses of D flip-flop designs with different threshold-voltage options in a 7-nm bulk FinFET technology are examined. Experimental data imply that single-event cross-section depends ...
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(2014-04-27)Department: Electrical EngineeringPower consumption has become a major concern of integrated circuit (IC) design. Reducing the supply voltage to the near-threshold region is one method to reduce the power consumption. However, operating in this region makes ...