Browsing by Subject "deep submicron"

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    • Analysis of single event vulnerabilities in a 130 nm CMOS technology 
      Amusan, Oluwole Ayodele (2006-09-01)
      Department: Electrical Engineering
      The amount of charge required to represent a logic state in CMOS digital circuits has been reduced dramatically with the scaling of supply voltage and nodal capacitances, making radiation-induced single event effects ...