Browsing by Subject "direct ionization"

Now showing items 1-3 of 3

    • Radiation-Induced Energy Deposition and Single Event Upset Error Rates in Scaled Microelectronic Structures 
      Howe, Christina L (2005-12-16)
      Department: Electrical Engineering
      Energy deposition from particles in space can cause upsets in microelectronic devices resulting in unreliable systems. A Geant4 based application, MRED (Monte Carlo Radiative Energy Deposition), is used to investigate ...
    • The Radiation Response of Focal Plane Arrays 
      Howe, Christina L (2008-12-17)
      Department: Electrical Engineering
      Using Monte Carlo based simulations, the proton-induced energy deposition in a silicon PIN focal plane array was analyzed, and the importance of considering the materials surrounding a device was shown by comparing the ...
    • The Role of Singly-Charged Particles in Microelectronics Reliability 
      Sierawski, Brian David (2011-12-02)
      Department: Electrical Engineering
      Lightly ionizing particles in any radiation environment have the potential to induce single event upsets in scaled CMOS technologies. As microelectronic devices become smaller and require less charge to hold state, they ...