Browsing by Author "Bharat L. Bhuva"
Now showing items 1-20 of 28
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Loveless, Thomas Daniel (2009-08-27)Department: Electrical EngineeringA reliability concern of growing interest in the microelectronics community is the deleterious effect of ionizing radiation. The so-called "single events" – single particles which can penetrate semiconductor material ...
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Chetia, Jugantor (2012-02-03)Department: Electrical EngineeringSoft errors induced by radiation particles are increasingly becoming a source of concern for reliable design of VLSI systems. An important parameter to quantify the soft error response of a system is Architectural ...
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Holt, Christopher (2008-04-23)Department: Electrical EngineeringDynamic logic circuitry is generally faster and smaller than equivalent static logic circuits. The use of these circuits in space is desirable, but not much work has been performed in assessing their vulnerability to the ...
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Amusan, Oluwole Ayodele (2006-09-01)Department: Electrical EngineeringThe amount of charge required to represent a logic state in CMOS digital circuits has been reduced dramatically with the scaling of supply voltage and nodal capacitances, making radiation-induced single event effects ...
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Reece, Trey (2014-12-05)Department: Electrical EngineeringSystem security often focuses on the software, causing hardware security to be overlooked. Such oversight allows for attacks that can completely undermine the use of hardware as the root of trust. During the design of an ...
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Narasimham, Balaji (2008-12-06)Department: Electrical EngineeringRadiation-induced soft errors have become a key reliability issue for advanced semiconductor integrated circuits. With technology scaling, a large fraction of the observed soft failures are estimated to be related to latched ...
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Jiang, Hui (2018-03-20)Department: Electrical EngineeringA single-event effect (SEE) of circuits is strongly dependent on the supply voltage and the physical capacitance. Reduction in supply voltage as well as technology scaling trends (smaller nodal capacitances) may result in ...
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Reece, Trey (2009-12-10)Department: Electrical EngineeringDetecting malicious modifications to a circuit is a daunting task, regardless of the medium. In a fabricated circuit, most methods of detecting hardware Trojans rely on small changes in side-channel measurements, which ...
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Subramanian, Karthik (2008-08-05)Department: Electrical EngineeringCVD diamond is an excellent material for field emission with low electron affinity, robust mechanical and chemical properties, high thermal conductivity, and ability to withstand extreme temperature and radiation. However, ...
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Jiang, Hui (2015-03-25)Department: Electrical EngineeringThis thesis demonstrates the feasibility of designing and building a Drosophila automated training and testing system for Pavlovian classical associative learning/memory analyses using inexpensive hardware and software ...
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Chatterjee, Indranil (2014-08-01)Department: Electrical EngineeringThe total ionizing dose induced degradation in advanced deep-submicron CMOS technologies has been significantly reduced by scaling. Damage to isolating field oxides remains a significant threat for integrated circuits ...
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Zhang, Hangfang (2018-04-12)Department: Electrical EngineeringModern ICs need to be designed with proper designer-controllable factors to meet power, speed and single-event (SE) performance requirements in different applications. Commercial fabrication houses have successfully ...
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Kou, Lingbo (2014-04-27)Department: Electrical EngineeringPower consumption has become a major concern of integrated circuit (IC) design. Reducing the supply voltage to the near-threshold region is one method to reduce the power consumption. However, operating in this region makes ...
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Gadlage, Matthew John (2010-04-10)Department: Electrical EngineeringSingle-event transients (SETs) are a significant reliability issue for space-based electronic systems. A single-event transient is a radiation-induced glitch in an electronic circuit caused by an ionizing particle. While ...
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Rong, Guoguang (2008-08-25)Department: Electrical EngineeringThe need to develop highly sensitive, selective, and cost-effective biosensors spans the areas of medicine, the environment, food safety, and homeland security. Accurate and reliable detection of trace quantities of small ...
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Kiddie, Bradley Thomas (2012-03-26)Department: Electrical EngineeringAs feature sizes and operating voltages decrease, single-event transients from particle strikes in logic circuits become more probable. Much literature is available on the effects of these events in memory, but with ...
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Adeleke, Adeola (2012-03-14)Department: Electrical EngineeringContinuing CMOS devices scaling causes an increase in the vulnerability of integrated circuits to radiation-induced soft errors. Furthermore, as transistor density increases, the probability of transistors failing increases ...
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Limbrick, Daniel Brian (2009-12-14)Department: Electrical EngineeringSoft errors can alter the correct execution of code within a microprocessor, particularly if control logic is compromised. This thesis addresses the vulnerability of a microprocessor’s control logic by assigning a signature ...
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Raina, Supil (2011-12-13)Department: Interdisciplinary Materials ScienceProperties such as high electrical conductivity; chemical and electrochemical stability over a wide range of conditions; rapid electron transfer kinetics for different redox systems; and reproducible electrical, microstructural ...
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Narasimham, Balaji (2005-12-13)Department: Electrical EngineeringIt is now well known to the radiation effects community that single event effects caused by energetic particles, particularly single event transients, will be among the dominant reliability issues in advanced integrated ...